VLSI-SoC: Design for Reliability, Security, and Low Power
VLSI-SoC: Design for Reliability, Security, and Low Power
23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Choi, Kiyoung; Shin, Youngsoo; Reis, Ricardo; Tsui, Chi Ying; Kim, Jae-Joon
Springer International Publishing AG
04/2018
223
Mole
Inglês
9783319834405
15 a 20 dias
3693